Nicolet FT-IR的AEM模塊
| The AEM is ideal for laboratories that perform one type of experiment consistently, but still require sampling flexibility, because it provides and additional sample compartment, identical in configuration to that of the Nicolet FT-IR series spectrometer. Built on a precision-cast baseplate with pinned positions for optical components, the AEM provides permanent stability and alignment. • Dual-detector optics• Pre-aligned detectors • Purging flexibility The AEM expands experimental flexibility by providing an additional sample compartment identical in configuration to that of the NicoletTM FT-IR series spectrometer. It is ideal for laboratories that perform one type of experiment consistently but seek sampling flexibility. It is compatible with all Nicolet FT-IR series spectrometer external sampling devices. The AEM features standard dual detector optics with computerized selection of either front or rear detector positions. In addition, pre-aligned detectors may be freely exchanged between the main spectrometer and the AEM detector positions without any alignment. The AEM's purge port adds to compartment purging flexibility. It has optional sealed and desiccated optics to provide flexible non-purged operation. Snap-InTM kinematic mounted baseplates on the AEM eliminate the need for manual alignment when changing accessories. Accessories are fully interchangeable between the AEM and the main spectrometer. The AEM can be dedicated to a specific sampling method, leaving the main sample compartment available for more flexible sampling. |
