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原子力顯微鏡AFM探針 NanoSensors（二）

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公司名稱天津奧辛博科技有限責任公司
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更新時間2025/1/25 12:43:03
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天津奧辛博科技有限責任公司是豪森國際（香港）有限公司在中國大陸的分支機構(gòu)，注冊于渤海之濱的天津*產(chǎn)業(yè)園區(qū)，為廣大的中國用戶提供全套的實驗室裝備和技術(shù)解決方案。公司銷售網(wǎng)絡(luò)覆蓋全國并已經(jīng)在上海、廣州和重慶設(shè)立分公司，為用戶提供售前咨詢、進口代理、售后應用支持和維修等全方面立體式服務。自2002年成立以來已同多個儀器廠商建立了良好的戰(zhàn)略合作關(guān)系，如美國Keysight公司、美國KLA-Tencor公司、法國Formulaction公司、美國BI公司、美國IBSS Group公司、美國BeckmanCoulter公司、美國TA公司、英國Renishaw公司、美國Thermofisher公司、美國PE公司、新加坡BioPSI公司等。近幾年，分子生物物理研究的迅速發(fā)展，前沿的科學技術(shù)已經(jīng)為在分子水平上了解一些重要生命現(xiàn)象的本質(zhì)和機理提供可能，這一影響力已迅速擴展到分子生物學、免疫學、藥物學、合成化學、理論化學、蛋白質(zhì)工程學等各方面，公司重點轉(zhuǎn)移至納米材料科學和生物分子學兩大領(lǐng)域的專業(yè)儀器的引進,并簽約代理美國Keysight公司、美國BI公司、新加坡BioPSI公司的產(chǎn)品，成為單分子生物物理領(lǐng)域國內(nèi)能提供全面檢測手段的代理商。公司強大的技術(shù)團隊充分保障了公司的技術(shù)能力和服務標準在激烈的市場競爭中始終處于地位。我們堅信用戶滿意和支持是公司發(fā)展的生命線。公司以誠信的經(jīng)營之道贏得客戶的信任，以過硬的技術(shù)水平贏得客戶的尊重和認可，在業(yè)內(nèi)具有深遠的影響力，已成為大型科研儀器進口商的*。

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原子力顯微鏡AFM探針 NanoSensors（二）

原子力顯微鏡AFM探針 NanoSensors（二）產(chǎn)品信息

型號	盒(根)	產(chǎn)品描述
SSS-SEIH	10	Silicon cantilever for non-contact/tapping -mode,special type A, with SUPERSHARPSILICON tip
	20
	50
SSS-SEIHR	10	Silicon cantilever for non-contact/tapping -mode,special type A, with SUPERSHARPSILICON tip detector side : Al-coating
	20
	50
qp-CONT	10	生物探針，懸臂梁: 共振頻率11kHz 力常數(shù) 0.01 N/m; 應用范圍：生物探針、液體探針；優(yōu)勢：力常數(shù)和共振頻率波動范圍小，特別適用于的定量納米力學研究和生物測試
	20
	50
qp-SCONT	10	生物探針，懸臂梁: 共振頻率11kHz 力常數(shù) 0.01 N/m; 應用范圍：生物探針、液體探針；優(yōu)勢：力常數(shù)和共振頻率波動范圍小，特別適用于的定量納米力學研究和生物測試
	20
	50
PtSi-CONT	10	導電探針，鍍層: 鉑硅；比常規(guī)導電探針更耐磨，電學信號更長久，重復性好、分辨率高。應用范圍：導電探針
	20
	50
ATEC-CONT	10	接觸模式硅探針
	20
	50
ATEC-CONTPt	10	接觸模式硅探針，鍍層：Pt/Ir
	20
	50
ATEC-CONTAu	10	接觸模式探針，臂梁及針尖鍍層：鍍金
ppp-CONT	10	接觸模式探針，
	20
	50
PPP-CONT-W	380
PPP-CONTR	10	接觸模式探針，鍍層：Al
	20
	50
PPP-CONTR-W	380
PPP-XYCONTR	10	接觸模式探針，鍍層：Al ,XY-auto aligment
	20
	50
PPP-CONTPt	10	Silicon cantilever for contact mode, detector side :Pt/Ir-coating ,tip side : Pt/Ir-coating
	20
	50
PPP-CONTPt-W	380
PPP-CONTAu	10	Silicon cantilever for contact mode, detector and tip side : Au-coating
PPP-CONTAuD	10	Silicon cantilever for contact mode, detector side : Au-coating
DT-CONTR	10	金剛石探針，接觸模式，鍍層：Al
	20
	50
CDT-CONTR	10	導電金剛石探針，接觸模式，鍍層：Al
	20
	50
PPP-ZEILR	10	silicon cantilever for contact mode, special type, detector side :Al-coating
	20
	50
PPP-ZEILR-W	380
PPP-RT-CONTR	10	silicon cantilever for contact mode, tip rotated by 180°,detector side :Al-coating
	20
	50
PL2-CONT	10	Silicon-SPM-Probe with plateau tip, silicon cantilever for contact mode,
PL2-CONTR	10	Silicon-SPM-Probe with plateau tip, silicon cantilever for contact mode, detector side: Al-coating
TL-CONT	10	Tipless silicon cantilever based on POINTPROBE technology
	20
	50
PPP-CONTSC	10	silicon cantilever for contact mode, short cantilever
	20
	50
PPP-CONTSCR	10	silicon cantilever for contact mode, short cantilever, detector side :Al-coating
	20
	50
PPP-CONTSCR-W	380
PPP-CONTSCPt	10	silicon cantilever for contact mode, short cantilever, detector side :Pt/Ir-coating
	20
	50
PPP-CONTSCAu	10	silicon cantilever for contact mode, short cantilever, detector and tip side :Au-coating
PPP-CONTSCAuD	10	silicon cantilever for contact mode, short cantilever, detector side :Au-coating
PtSi-FM	10	導電探針，鍍層: 鉑硅；比常規(guī)導電探針更耐磨，電學信號更長久，重復性好、分辨率高。應用范圍：導電探針
	20
	50
ATEC-FM	10	軟輕敲探針，鍍層: 無；針尖可視的探針，可應用到對于那些針尖需要被精確定位或必須針尖可見的應用（例如，用于納米操作）來說，ATEC是必然的。由于其超小的半錐角，ATEC系列產(chǎn)品在陡峭的小尺寸圖案樣品測量中表現(xiàn)出很好的性能. Silicon cantilever for force modulation mode,
	20
	50
ATEC-EFM	10	Silicon cantilever for force modulation mode, detector and tip side:Pt/Ir-coating
	20
	50
ATEC-FMAu	10	Silicon cantilever for force modulation mode, detector and tip side:Au-coating
PPP-LFMR	10	Silicon cantilever for lateral/friction force microscopy,detector side: Al-coating
	20
	50
PPP-LFMR-W	380
PPP-FM	10	Silicon cantilever for force modulation mode,
	20
	50
PPP-FM-W	380
PPP-FMR	10	Silicon cantilever for force modulation mode, detector side:Al-coating
	20
	50
PPP-FMR-W	380
PPP-FMAu	10	Silicon cantilever for force modulation mode, detector and tip side: Au-coating
PPP-FMAuD	10	Silicon cantilever for force modulation mode, detector side: Au-coating
PPP-QFMR	10	Silicon cantilever for force modulation mode, High quality factor for UHV applications, detector side: Al-coating
PPP-RT-FMR	10	Silicon cantilever for force modulation mode, Tip rotated by 180°,detector side: Al-coating
	20
	50
PL2-FM	10	Silicon-SPM-Probe with plateau tip, Silicon cantilever for force modulation mode,
PL2-FMR	10	Silicon-SPM-Probe with plateau tip, Silicon cantilever for force modulation mode, detector side:Al-coating
TL-FM	10	Tipless silicon cantilever based on POINTPROBE technology
	20
	50
SSS-FM	10	Silicon cantilever for force modulation mode, With SUPERSHARPSILICON tip
	20
	50
SSS-FMR	10	Silicon cantilever for force modulation mode, With SUPERSHARPSILICON tip, detector side:Al-coating
	20
	50
DT-FMR	10	金剛石探針，Silicon cantilever for force modulation mode, 鍍層：Al
	20
	50
CDT-FMR	10	導電金剛石探針，Silicon cantilever for force modulation mode, 鍍層：Al
	20
	50
PPP-EFM	10	Silicon cantilever for electrostatic force Microscopy, detector side:Pt/Ir-coating , tip side: Pt/Ir-coating
	20
	50
PPP-EFM-W	370
PPP-MFMR	10	Silicon cantilever for Magnetic force Microscopy, detector side:Al-coating , tip side: hard magnetic coating
	20
	50
PPP-MFMR-W	370
PPP-LM-MFMR	10	Silicon cantilever for Magnetic force Microscopy, Low Moment ,detector side:Al-coating , tip side: hard magnetic coating
	20
	50
PPP-LC-MFMR	10	Silicon cantilever for Magnetic force Microscopy, Low Coercivity ,detector side:Al-coating , tip side: hard magnetic coating
	20
	50
PPP-QLC-MFMR	10	Silicon cantilever for Magnetic force Microscopy, Low Coercivity ,high quality factor for UHV applications,detector side:Al-coating , tip side: hard magnetic coating
SSS-MFMR	10	Silicon cantilever for high resolution Magnetic force Microscopy, detector side:Al-coating , tip side: hard magnetic coating
	20
	50
SSS-QMFMR	10	Silicon cantilever for Magnetic force Microscopy, ,high quality factor for UHV applications,detector side:Al-coating , tip side: hard magnetic coating
2D200	1	CALIBRATION STANDARD for x-y calibration of the scanning mechanism,lattice of inverted pyramids,200nm pitch
2D300	1	CALIBRATION STANDARD for x-y calibration of the scanning mechanism,lattice of inverted pyramids,300nm pitch
H8	1	HEIGHT STANDARD for very precise z-calibration,nominal step height: 8nm
FLAT	1	FLATNESS STANDARD for analysis and correction of the scanner bow,smooth plane with a maximum peak to valley distance of 10nm on a 100x100u㎡ area