| qp-fast | 10 | 統(tǒng)一質(zhì)量SPM探針,三個(gè)矩形懸臂,軟/標(biāo)準(zhǔn)/快速/動(dòng)態(tài)AFM分別成像, |
| 20 | ||
| 50 | ||
| qp-HBC | 10 | 鍍層: 懸臂背面鍍鋁； 針尖形狀: 角錐形; 懸臂梁: 頻率 60 kHz 力常數(shù) 0.5 N/m 長(zhǎng)度 115 μm; 應(yīng)用范圍：智能探針 |
| 20 | ||
| 50 | ||
| qp-BioT | 10 | qp-BioT探針有兩個(gè)三角懸臂梁，懸臂梁: 力常數(shù) 0.08 N/m 0.3 N/m; 應(yīng)用范圍：生物探針、液體探針；優(yōu)勢(shì)：力常數(shù)和共振頻率波動(dòng)范圍小，特別適用于的定量納米力學(xué)研究和生物測(cè)試 |
| 20 | ||
| 50 | ||
| qp-BioAC | 10 | qp-BioAC探針三個(gè)懸臂梁，懸臂梁: 力常數(shù) 0.06 N/m 0.1 N/m 0.3 N/m; 應(yīng)用范圍：生物探針、液體探針；優(yōu)勢(shì)：力常數(shù)和共振頻率波動(dòng)范圍小，特別適用于的定量納米力學(xué)研究和生物測(cè)試 |
| 20 | ||
| 50 | ||
| qp-BioAC-CI | 10 | qp-BioAC-CI探針三個(gè)懸臂梁，懸臂梁: 力常數(shù) 0.06 N/m 0.1 N/m 0.3 N/m; 應(yīng)用范圍：生物探針,細(xì)胞探針；優(yōu)勢(shì)：力常數(shù)和共振頻率波動(dòng)范圍小，特別適用于的定量納米力學(xué)研究和細(xì)胞測(cè)試 |
| 20 | ||
| 50 | ||
| PtSi-NCH | 10 | 新導(dǎo)電探針，鍍層: 鉑硅； 比常規(guī)導(dǎo)電探針更耐磨，電學(xué)信號(hào)更長(zhǎng)久，重復(fù)性好、分辨率高。應(yīng)用范圍：導(dǎo)電探針 |
| 20 | ||
| 50 | ||
| ATEC-NC | 10 | 輕敲探針，鍍層: 無(wú)； 針尖可視的探針，可應(yīng)用到對(duì)于那些針尖需要被精確定位或必須針尖可見的應(yīng)用（例如，用于納米操作）來(lái)說(shuō)，ATEC是必然的。由于其很小的半錐角，ATEC系列產(chǎn)品在陡峭的小尺寸圖案樣品測(cè)量中表現(xiàn)出很好的性能。 |
| 20 | ||
| 50 | ||
| ATEC-NCPt | 10 | 導(dǎo)電探針，鍍層: 鉑銥； 針尖可視的探針，可應(yīng)用到對(duì)于那些針尖需要被精確定位或必須針尖可見的應(yīng)用（例如，用于納米操作）來(lái)說(shuō)，ATEC是必然的。由于其很小的半錐角，ATEC系列產(chǎn)品在陡峭的小尺寸圖案樣品測(cè)量中表現(xiàn)出很好的性能。 |
| 20 | ||
| 50 | ||
| PPP-NCH | 10 | 輕敲探針，鍍層: 無(wú)； 其小于7納米的典型半徑和很小的探針個(gè)體差異提高了圖像的分辨率并保證了圖像的可重復(fù)性。 |
| 20 | ||
| 50 | ||
| PPP-NCH-W | 380 | |
| PPP-NCHR | 15 | 輕敲探針，鍍層: 懸臂背面鍍鋁； 其小于7納米的典型半徑和很小的探針個(gè)體差異提高了圖像的分辨率并保證了圖像的可重復(fù)性。 |
| 20 | ||
| 50 | ||
| PPP-NCHR-W | 380 | |
| PPP-NCHPt | 10 | 導(dǎo)電探針，鍍層: 鉑銥； 其小于25納米的典型半徑和很小的探針個(gè)體差異提高了圖像的分辨率并保證了圖像的可重復(fù)性。 |
| 20 | ||
| 50 | ||
| PPP-NCHPt-W | 380 | |
| ATEC-NCAu | 10 | 導(dǎo)電探針，鍍層: 金； 針尖可視的探針，可應(yīng)用到對(duì)于那些針尖需要被精確定位或必須針尖可見的應(yīng)用（例如，用于納米操作）來(lái)說(shuō)，ATEC是必然的。由于其很小的半錐角，ATEC系列產(chǎn)品在陡峭的小尺寸圖案樣品測(cè)量中表現(xiàn)出很好的性能。 |
| PPP-NCHAu | 10 | 導(dǎo)電探針，鍍層: 金； 其小于25納米的典型半徑和很小的探針個(gè)體差異提高了圖像的分辨率并保證了圖像的可重復(fù)性。 |
| PPP-NCHAuD | 10 | 導(dǎo)電探針，鍍層: 金； 其小于25納米的典型半徑和很小的探針個(gè)體差異提高了圖像的分辨率并保證了圖像的可重復(fù)性。 |
| PPP-XYNCHR | 10 | 輕敲探針，鍍層: 懸臂背面鍍金； 此探針具有杰出的運(yùn)行穩(wěn)定性，優(yōu)異的靈敏度以及快速掃描能力。 |
| 20 | ||
| 50 | ||
| PPP-QNCHR | 10 | 輕敲探針，鍍層: 懸臂背面鍍鋁； 其小于7納米的典型半徑和很小的探針個(gè)體差異提高了圖像的分辨率并保證了圖像的可重復(fù)性。 |
| PPP-RT-NCHR | 10 | 輕敲探針，鍍層: 懸臂背面鍍鋁； 其小于7納米的典型半徑和很小的探針個(gè)體差異提高了圖像的分辨率并保證了圖像的可重復(fù)性。 |
| 20 | ||
| 50 | ||
| PL2-NCH-10 | 10 | 輕敲探針，鍍層: 無(wú)；應(yīng)用:Plateau AFM Tips |
|
PL2-NCHR-10 | 10 | 輕敲探針，鍍層: 懸臂背面鍍鋁；應(yīng)用:Plateau AFM Tips |
|
TL-NCH | 10 | tipless探針，鍍層: 無(wú)； |
| 20 | ||
| 50 | ||
| SSS-NCH | 10 | 尖探針，鍍層: 無(wú)； 針尖形狀: 懸臂梁: 頻率 330 kHz 力常數(shù) 42 N/m 長(zhǎng)度 125 μm; 應(yīng)用范圍：輕敲探針 |
| 20 | ||
| 50 | ||
| SSS-NCHR | 10 | 尖探針，鍍層: 懸臂背面鍍鋁； 針尖形狀: 懸臂梁: 頻率 330 kHz 力常數(shù) 42 N/m 長(zhǎng)度 125 μm; 應(yīng)用范圍：輕敲探針 |
| 20 | ||
| 50 | ||
| AR5-NCH | 10 | HIGH ASPECT RATIO Probe,silicon cantilever for non-contact-/tapping-mode, HIGH ASPECT RATIO tip,aspect ratio ≥5:1 |
| 20 | ||
| 50 | ||
| AR5-NCH-W | 370 | |
| AR5T-NCH | 10 | TILT COMPENSATED HIGH ASPECT RATIO Probe, silicon cantilever for non-contact-/tapping-mode, HIGH ASPECT RATIO tip,aspect ratio ≥5:1,tilt compensation 13° |
| 20 | ||
| 50 | ||
| AR5T-NCH-W | 365 | |
| AR10-NCH | 10 | HIGH ASPECT RATIO Probe,silicon cantilever for non-contact-/tapping-mode, HIGH ASPECT RATIO tip,aspect ratio ≥10:1 |
| 20 | ||
| 50 | ||
| AR10-NCH-W | 370 | |
| AR10T-NCH | 10 | TILT COMPENSATED HIGH ASPECT RATIO Probe, silicon cantilever for non-contact-/tapping-mode, HIGH ASPECT RATIO tip,aspect ratio ≥10:1, tilt compensation 13° |
| 20 | ||
| 50 | ||
| AR10T-NCH-W | 365 | |
| AR5-NCHR | 10 | HIGH ASPECT RATIO Probe,silicon cantilever for non-contact-/tapping-mode, HIGH ASPECT RATIO tip,aspect ratio ≥5:1, detector side :Al-coating |
| 20 | ||
| 50 | ||
| AR5-NCHR-W | 370 | |
| AR5T-NCHR | 10 | TILT COMPENSATED HIGH ASPECT RATIO Probe, silicon cantilever for non-contact-/tapping-mode, HIGH ASPECT RATIO tip,aspect ratio ≥5:1,tilt compensation 13°detector side: Al-coating |
| 20 | ||
| 50 | ||
| AR5T-NCHR-W | 365 | |
| AR10-NCHR | 10 | HIGH ASPECT RATIO Probe,silicon cantilever for non-contact-/tapping-mode, HIGH ASPECT RATIO tip,aspect ratio ≥10:1 detector side :Al-coating |
| 20 | ||
| 50 | ||
| AR10-NCHR-W | 370 | |
| AR10T-NCHR | 10 | TILT COMPENSATED HIGH ASPECT RATIO Probe, silicon cantilever for non-contact-/tapping-mode, HIGH ASPECT RATIO tip,aspect ratio ≥10:1, tilt compensation 13°detector side: Al-coating |
| 20 | ||
| 50 | ||
| AR10T-NCHR-W | 365 | |
| DT-NCHR | 10 | DIAMOND COATED Probe, silicon cantilever for non-contact-/tapping-mode, detector side: Al-coating |
| 20 | ||
| 50 | ||
| CDT-NCHR | 10 | CONDUCTIVE DIAMOND COATED Probe, silicon cantilever for non-contact-/tapping-mode, detector side: Al-coating |
| 20 | ||
| 50 | ||
| PPP-NCST | 10 | 輕敲探針，鍍層: 無(wú)，針尖形狀: 錐形; 懸臂梁: 頻率 160 kHz 力常數(shù) 7.4 N/m 長(zhǎng)度 150 μm; 應(yīng)用范圍：軟輕敲探針 |
| 20 | ||
| 50 | ||
| PPP-NCST-W | 380 | |
| PPP-NCSTR | 10 | 輕敲探針，鍍層: 懸臂背面鍍鋁； 針尖形狀: 錐形; 懸臂梁: 頻率 160 kHz 力常數(shù) 7.4 N/m 長(zhǎng)度 150 μm; 應(yīng)用范圍：軟輕敲探針 |
| 20 | ||
| 50 | ||
| PPP-NCSTR-W | 380 | |
| PPP-NCSTPt | 10 | 導(dǎo)電探針，鍍層: 鉑銥； |
| 20 | ||
| 50 | ||
| PPP-NCSTPt-w | 380 | |
| PPP-NCSTAu | 10 | Silicon cantilever for non-contact-/tapping -mode,soft tapping, detector and tip side : Au-coating |
| PPP-NCSTAuD | 10 | Silicon cantilever for non-contact-/tapping -mode,soft tapping, detector and tip side : Au-coating |
| PPP-XYNCSTR | 10 | Silicon cantilever for non-contact-/tapping -mode,soft tapping, detector and tip side : Al-coating,XY-auto aligment |
| 20 | ||
| 50 | ||
| PPP-NCL | 10 | Silicon cantilever for non-contact -/tapping -mode, long cantilever |
| 20 | ||
| 50 | ||
| PPP-NCL-W | 380 | |
| PPP-NCLR | 10 | Silicon cantilever for non-contact -/tapping -mode, long cantilever, detector side : Al-coating |
| 20 | ||
| 50 | ||
| PPP-NCLR-W | 380 | |
| PPP-NCLPt | 10 | Silicon cantilever for non-contact -/tapping -mode, long cantilever, detector side : Pt/Ir-coating, tip side : Pt/Ir-coating |
| 20 | ||
| 50 | ||
| PPP-NCLPt-W | 380 | |
| PPP-NCLAu | 10 | Silicon cantilever for non-contact -/tapping -mode, long cantilever, detector and tip side : Au-coating |
| PPP-NCLAuD | 10 | Silicon cantilever for non-contact -/tapping -mode, long cantilever, detector side : Au-coating |
| PL2-NCL | 10 | Silicon-SPM-Probe with plateau tip, silicon cantilever for non-contact-/tapping -mode,long cantilever |
| PL2-NCLR | 10 | Silicon-SPM-Probe with plateau tip, silicon cantilever for non-contact-/tapping -mode,long cantilever, detector side: Al-coating |
| TL-NCL | 10 | Tipless silicon cantilever based on POINTPROBE technology |
| 20 | ||
| 50 | ||
| SSS-NCL | 10 | 尖探針，鍍層: 無(wú)； 針尖形狀: 懸臂梁: 頻率 190 kHz 力常數(shù) 48 N/m 長(zhǎng)度 225 μm; 應(yīng)用范圍：輕敲探針 |
| 20 | ||
| 50 | ||
| SSS-NCLR | 10 | 尖探針，鍍層: 懸臂背面鍍鋁； 針尖形狀: 懸臂梁: 頻率 190 kHz 力常數(shù) 48 N/m 長(zhǎng)度 225 μm; 應(yīng)用范圍：輕敲探針 |
| 20 | ||
| 50 | ||
| AR5-NCL | 10 | 高長(zhǎng)徑比探針，鍍層: 無(wú)； 針尖形狀: 高長(zhǎng)徑比; 懸臂梁: 頻率 190 kHz 力常數(shù) 48 N/m 長(zhǎng)度 225 μm; 應(yīng)用范圍：高長(zhǎng)徑比探針 |
| 20 | ||
| 50 | ||
| AR5-NCL-W | 370 | |
| AR5-NCLR | 10 | 高長(zhǎng)徑比探針，鍍層: 懸臂背面鍍鋁； 針尖形狀: 高長(zhǎng)徑比; 懸臂梁: 頻率 190 kHz 力常數(shù) 48 N/m 長(zhǎng)度 225 μm; 應(yīng)用范圍：高長(zhǎng)徑比探針 |
| 20 | ||
| 50 | ||
| AR5-NCLR-W | 370 | |
| DT-NCLR | 10 | 金剛石探針，高長(zhǎng)徑比探針，硅懸臂非接觸式- /敲擊模式，鍍層: 懸臂背面鍍鋁 |
| 20 | ||
| 50 | ||
| CDT-NCLR | 10 | 導(dǎo)電金剛石探針，高長(zhǎng)徑比探針，硅懸臂非接觸式- /敲擊模式，鍍層: 懸臂背面鍍鋁 |
| 20 | ||
| 50 | ||
| A-Probe | 10 | AKiyama-Probe, self-sensing and self-actuating(-exciting) probe for dynamic mode AFM |
| PPP-SEIH | 10 | Silicon cantilever for non-contact/tapping -mode,special type A. |
| 20 | ||
| 50 | ||
| PPP-SEIH-W | 380 | |
| PPP-SEIHR | 10 | Silicon cantilever for non-contact/tapping -mode,special type A, detector side : Al-coating |
| 20 | ||
| 50 | ||
| PPP-SEIHR-W | 380 |
