RED-Wave 紅外InGaAs 光纖光譜儀,光譜范圍900-2300nm,TEC制冷到-10°C,信噪比可以做到4000:1。積分時間1ms到30s。該紅外InGaAs 光纖光譜儀的*高分辯率可以達到3.1nm。
- 光譜測試范圍900-2300 nm or 900–1700nm
- 近紅外光譜測試和寬帶寬應(yīng)用
- 512 or 1024 像素InGaAs 和PDA探測器
- 集成熱電制冷(TEC)到-10°C
- Windows XP/Vista/7 操作程序
- 高速USB-2接口,即插即用
Specifications Zero defect 512 detector RED-Wave NIR InGaAs Spectrometer | |
動態(tài)范圍: 4000:1 with 5 decades | 尺寸: 150 x 100 x 68.8 mm |
分辨率: 見下表( 25μm slit) | 功率: 2 Amps @ 5 VDC |
像素尺寸: 25um x 500um | A/D轉(zhuǎn)化: 16-bit |
像素阱深: 130 x108 electrons | 數(shù)據(jù)轉(zhuǎn)換速度: 40x faster than USB-1 |
阱深控制: 130 x108 or 5 x106 el. | 積分時間: 1ms to 30s |
信噪比: 4000:1 with TEC cooling(900-1700nm) 400:1 with 2x TEC cooling(900-2300nm) | 狹縫選擇: 25, 50,100, or 200μm |
軟件: SpectraWiz program & apps |
標(biāo)準(zhǔn)型號
RED-Wave Models | Number of Elements | Spectrometer Range (nm) | Grating (g/mm) | Grating Range (nm) | Dispersion (nm/pixel) | Estimated Resolving Resolution |
NIR | 512 | 900-1700 | 250 | 800nm | 1.562 | 3.1nm |
NIRb | 512 | 900-1600 | 300 | 650nm | 1.269 | 2.5nm |
NIR2 | 512 | 1250-1575 | 600 | 325nm | 0.634 | 1.3nm |
NIR2b | 512 | 1150-1475 | 600 | 325nm | 0.634 | 1.3nm |
NIR | 1024 | 1000-1700 | 600 | 700nm | 0.683 | 1.4nm |
NIR3-HR | 512 | 1530-1605 | 1200 | 70nm | 0.195 | 0.4nm |
NIR3-HR | 1024 | 1500-1640 | 1200 | 140nm | 0.195 | 0.4nm |
NIRX | 512 | 1500-2200 | 300 | 700nm | 1.367 | 2.8nm |
NIRX | 1024 | 1500-2200 | 600 | 700nm | 0.683 | 1.4nm |
NIRX-SR | 512 | 900-2300 | 300 | 1400nm | 5.3 | <13nm |
NIRX-SR | 1024 | 900-2300 | 600 | 1400nm | 2.7 | <7nm |