晶體尺寸:8毫米
電學(xué)性能:半金屬,電荷密度波(CDW,~ 63K),超導(dǎo)體(TC ~ 2K)
晶體結(jié)構(gòu):?jiǎn)涡绷?/span>
晶胞參數(shù):a = 0.5864nm,B = 0.3918nm,C = 1.009nm,α=γ= 90°,γ= 98
晶體類型:合成
晶體純度:>99.995%
表征方法:XRD、拉曼、EDX
X-ray diffraction on a ZrTe3 single crystal aligned along the (001) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 5 XRD peaks correspond, from left to right, to (00l) with l = 2, 3, 4, 5, 6, 7, 8
Powder X-ray diffraction (XRD) of a single crystal ZrTe3. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.
Stoichiometric analysis of a single crystal ZrTe3 by Energy-dispersive X-ray spectroscopy (EDX).
Raman spectrum of a single crystal ZrTe3. Measurement was performed with a 785 nm Raman system at room temperature.